Digital Systems Testing & Testable Design
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
Kategorije:
Godina:
1994
Izdanje:
1
Izdavač:
Wiley-IEEE Press
Jezik:
english
Strane:
653
ISBN 10:
0780310624
ISBN 13:
9780780310629
Fajl:
PDF, 7.36 MB
IPFS:
,
english, 1994